Innovative Multi-Bit Test Pattern Generators with Variable LFSR Selection Mechanisms

Author(s)	ROOPA K R, BRUNDA s KOTIAN, Dhanya shree U, Karunya P, Shardul S
Country	India
Abstract	Test Pattern Generators is an important module for testing Asynchronous circuits that guarantee fault detection. In this paper a multi-bit TPGs with tunable LFSR lengths is presented. Our method enables smooth transitions between various word lengths by dynamically selecting LFSR configurations based on control signals. For 4-bit to 7-bit combinational circuits, we have derived a polynomial-based LFSRs and shown effect of stuck-at-fault detections through extensive testing. It includes a discussion of instructional insights regarding fault coverage and digital circuit design. By bridging fixed and flexible BIST solutions, our adaptive TPG design improves fault detection capabilities.
Keywords	BIST, TPG , LFSR ,Multi-Bit
Field	Engineering
Published In	Volume 6, Issue 5, September-October 2024
Published On	2024-10-12
DOI	https://doi.org/10.36948/ijfmr.2024.v06i05.27683

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