International Journal For Multidisciplinary Research

E-ISSN: 2582-2160   •   Impact Factor: 9.24

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Volume 8 Issue 3
May-June 2026

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Calculation of Optical constants of Ta2O5 thin film.

Author(s) Dr. Laveena Manjulatha Parigala
Country India
Abstract The optical costants of tantalum pentoxide thin films, including refrective index(n),extinction coefficient (k),and absorption coefficient (a),plays a crucial role in the design of optical coatings, waveguides, and sensors, in this study, thin films were fabricated using a pulsed leaser deposition (pld) technique on glass substrates. The films thickness morphyology and optical properties were systematically analyzed. Spectroscopic ellipsometry (se) and UV-Vis spectrophotometer. Based on these experimental data , key optical constants such as refractive index(n),extinction (a) were determined using appropriate theoretical models and equations.
The refractive index was found to vary with wavelength, showing normal dispersion behaviour, while the extinction coefficient remained low in the visible region, indicating high transparency of the films. The optical band gap was also estimated using Tauc’s plot ,confirming the insulating nature of Ta2O5. Film thickness and surface uniformity were considered in the analysis to improve the accuracy of calculated constants. The results demonstrate that Ta2O5. Thin films possess desirable optical characteristics ,making them suitable for applications in anti-reflective coatings,optical filters andwave guides.
Keywords Tantalum pentoxide, thin films, optical constants, refractive index, extinction coefficient, spectroscopic ellipsometry, pulsed laser deposition.
Field Physics > Nano Technology / Nuclear
Published In Volume 8, Issue 3, May-June 2026
Published On 2026-05-05
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E-ISSN 2582-2160
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