International Journal For Multidisciplinary Research
E-ISSN: 2582-2160
•
Impact Factor: 9.24
A Widely Indexed Open Access Peer Reviewed Multidisciplinary Bi-monthly Scholarly International Journal
Home
Research Paper
Submit Research Paper
Publication Guidelines
Publication Charges
Upload Documents
Track Status / Pay Fees / Download Publication Certi.
Editors & Reviewers
View All
Join as a Reviewer
Get Membership Certificate
Current Issue
Publication Archive
Conference
Publishing Conf. with IJFMR
Upcoming Conference(s) ↓
WSMCDD-2025
GSMCDD-2025
AIMAR-2025
ICICSF-2025
IC-AIRCM-T³
Conferences Published ↓
SVGASCA (2025)
ICCE (2025)
RBS:RH-COVID-19 (2023)
ICMRS'23
PIPRDA-2023
Contact Us
Plagiarism is checked by the leading plagiarism checker
Call for Paper
Volume 7 Issue 6
November-December 2025
Indexing Partners
Subthreshold Conduction in MOS Transistors
| Author(s) | Tarun Parmar |
|---|---|
| Country | United States |
| Abstract | Analytical models are reviewed in this paper which accounts for drain current in subthreshold region of operation of MOS transistor. Standard modeling approaches are discussed in the form of long-channel and short channel. The comparison of the theoretical models is discussed with experimental models [1, 2]. The drain current dependence on gate bias is reviewed as subthreshold slope. Tunnel transistors having subthreshold swing less than the conventional limit are discussed. |
| Keywords | Subthreshold Conduction, Subthreshold Slope, Subthreshold Swing, Interband Tunnel Transistors. |
| Field | Engineering |
| Published In | Volume 1, Issue 1, July-August 2019 |
| Published On | 2019-07-10 |
| DOI | https://doi.org/10.36948/ijfmr.2019.v01i01.35937 |
| Short DOI | https://doi.org/g82wng |
Share this

E-ISSN 2582-2160
CrossRef DOI is assigned to each research paper published in our journal.
IJFMR DOI prefix is
10.36948/ijfmr
Downloads
All research papers published on this website are licensed under Creative Commons Attribution-ShareAlike 4.0 International License, and all rights belong to their respective authors/researchers.